EIA JESD 22-A110:2010現行
Highly Accelerated Temperature And Humidity Stress Test (Hast)
出版：JEDEC Solid State Technology Association
專家解讀視頻
基本信息
標準編號： EIA JESD 22-A110:2010
發布時間：2010/11/1 0:00:00
標準類別：Standard
出版單位：JEDEC Solid State Technology Association
標準頁數：14
標準簡介
Aims to evaluate the reliability of non-hermetic packaged solid-state devices in humid environments. Employs severe conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.
標準備注
Supersedes EIA JESD 22 (07/2004)
本標準替代的舊標準
