NBN EN 60749-31:2004現行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 31: Flammability Of Plastic-encapsulated Devices (internally Induced)
出版：Belgian Standards
專家解讀視頻
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to internal heating caused by excessive overloads.
Partially supersedes NBN EN 60749. (04/2004)
EN 60749-31:2003 - Identical
UNE EN 60749-31:2004 - Identical
SS EN 60749-31 Ed. 1 (2003) - Identical
I.S. EN 60749-31:2003 - Identical
NF EN 60749-31:2003 - Identical
DIN EN 60749-31 (2003-12) - Identical
BS EN 60749-31:2003 - Identical
SN EN 60749-31:2003 - Identical
DIN EN 60749-31 : 2003 - Identical
I.S. EN 60749-31:2003 - Identical
DIN EN 60749-31 : 2003 - Identical
SN EN 60749-31 : 2003 - Identical
BS EN 60749-31 : 2003 - Identical
