UNE EN 60749-31:2004現(xiàn)行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 31: Flammability Of Plastic-encapsulated Devices (internally Induced)
出版：Asociacion Espanola de Normalizacion
專家解讀視頻
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to internal heating caused by excessive overloads.
EN 60749-31:2003 - Identical
SS EN 60749-31 Ed. 1 (2003) - Identical
IEC 60749-31 Ed. 1.0 - Identical
I.S. EN 60749-31:2003 - Identical
NF EN 60749-31:2003 - Identical
DIN EN 60749-31 (2003-12) - Identical
BS EN 60749-31:2003 - Identical
SN EN 60749-31:2003 - Identical
NBN EN 60749-31:2004 - Identical
