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EIA JESD 22 A108:2005被替代
Temperature, Bias, And Operating Life
出版：JEDEC Solid State Technology Association
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基本信息
標(biāo)準(zhǔn)編號： EIA JESD 22 A108:2005
發(fā)布時(shí)間：2005/6/1 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：JEDEC Solid State Technology Association
標(biāo)準(zhǔn)頁數(shù)：14
標(biāo)準(zhǔn)簡介
Determines the effects of bias conditions and temperature, over time, on solid state devices is now available. Includes low temperature operating life (LTOL) and high temperature gate bias (HTGB) stress conditions, revised cool down requirements for high temperature stress, and a procedure to follow if parts are not tested within the allowed time window.
標(biāo)準(zhǔn)備注
Supersedes EIA JESD 22 (07/2004)
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