NBN EN 60749-27 : 2007 AMD 1 2012現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
出版：Belgian Standards
專家解讀視頻
Describes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).
BS EN 60749-27 : 2006 - Identical
DIN EN 60749-27 : 2013 - Identical
I.S. EN 60749-27:2006 - Identical
DIN EN 60749-27 : 2013 - Identical
