NEN EN IEC 60749-9:2002被替代
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 9: Permanence Of Marking
出版：Nederlands Normalisatie Instituut
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基本信息
標準編號： NEN EN IEC 60749-9:2002
發布時間：2002/9/1 0:00:00
標準類別：Standard
出版單位：Nederlands Normalisatie Instituut
標準頁數：9
標準簡介
Describes about the test and verifies that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
標準備注
Partially supersedes NEN EN IEC 60749. (12/2002)
本標準替代的舊標準
替代本標準的新標準
