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BS EN 60749-13:2002現行

Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere

出版:British Standards Institution

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基本信息
標準編號: BS EN 60749-13:2002
發布時間:2002/8/28 0:00:00
標準類別:Standard
出版單位:British Standards Institution
標準頁數:10
標準簡介

Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.

標準備注

? British Standards Institution 2013

Replaces notes:
Partially replaces BS EN 60749:1999.

Amendment notes:
AMD 14113 published 17 September 2002
AMD 14113 is a Corrigendum