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ASTM F744-92 (Invalid Record)被替代
Method For Measuring Dose Rate Threshold For Upset Of Digital Integrated Circuits
出版：American Society for Testing and Materials
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標(biāo)準(zhǔn)編號(hào)： ASTM F744-92 (Invalid Record)
標(biāo)準(zhǔn)類別：Standard
出版單位：American Society for Testing and Materials
標(biāo)準(zhǔn)頁數(shù)：0
標(biāo)準(zhǔn)簡介
CONTAINED IN VOL 10.04 Covers measurement of threshold level of radiation dose rate that causes upset in digital integrated circuits under static operating conditions. Radiation source is a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
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