
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
出版:American Society for Testing and Materials

專家解讀視頻
基本信息
標準編號: ASTM F744M-97(2003)
發布時間:1997/2/10 0:00:00
標準類別:Standard
出版單位:American Society for Testing and Materials
標準頁數:6
標準簡介
CONTAINED IN VOL. 10.04, 2006Describes the measurement of the threshold level of radiation dose rate that upsets digital integrated circuits during static operating conditions.
標準備注
Supersedes ASTM F 744.
(03/2002)
替代本標準的新標準