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IEC 60749 Ed. 2.0被替代
Semiconductor devices - Mechanical and climatic test methods
出版：International Electrotechnical Committee
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基本信息
標(biāo)準(zhǔn)編號(hào)： IEC 60749 Ed. 2.0
發(fā)布時(shí)間：1996/10/28 0:00:00
標(biāo)準(zhǔn)類(lèi)別：Standard
出版單位：International Electrotechnical Committee
標(biāo)準(zhǔn)頁(yè)數(shù)：95
標(biāo)準(zhǔn)簡(jiǎn)介
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
等同采用的國(guó)際標(biāo)準(zhǔn)
BS EN 60749:1999 - Identical
