CEI EN 60749-24 : 2012現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST
出版：Comitato Elettrotecnico Italiano
專家解讀視頻
基本信息
標準編號： CEI EN 60749-24 : 2012
發布時間：2012/1/1 0:00:00
標準類別：Standard
出版單位：Comitato Elettrotecnico Italiano
標準頁數：18
標準簡介
Defines accelerated stress testing (HAST) is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments.
本標準替代的舊標準
