IEC 60749-24 : 1.0現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST
出版：International Electrotechnical Committee
專家解讀視頻
Specifies the unbiased highly accelerated stress testing (HAST) which is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments.
DS EN 60749-24 : 2004 - Identical
DIN EN 60749-24 : 2004 - Identical
CEI EN 60749-24 : 2012 - Identical
BS EN 60749-24 : 2004 - Identical
PN EN 60749-24 : 2006 - Identical
NEN EN IEC 60749-24 : 2004 - Identical
I.S. EN 60749-24:2004 - Identical
