當(dāng)前位置：
首頁 >
標(biāo)準(zhǔn)詳情頁
EIA JESD 22-A115:1997被替代
Electrostatic Discharge (esd) Sensitivity Testing Machine Model (mm)
出版：JEDEC Solid State Technology Association
專家解讀視頻
基本信息
標(biāo)準(zhǔn)編號： EIA JESD 22-A115:1997
發(fā)布時(shí)間：1997/10/1 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：JEDEC Solid State Technology Association
標(biāo)準(zhǔn)頁數(shù)：0
標(biāo)準(zhǔn)簡介
Gives a procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined Machine Model (MM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable MM ESD test results so that accurate classifications can be performed.
標(biāo)準(zhǔn)備注
Supersedes EIA JESD 22 (07/2004)
本標(biāo)準(zhǔn)替代的舊標(biāo)準(zhǔn)
替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)
