IEC/TS 62396-2 Ed. 1.0被替代
Process management for avionics - Atmospheric radiation effects Part 2: Guidelines for single event effects testing for avionics systems
出版：International Electrotechnical Committee
專家解讀視頻
基本信息
標準編號： IEC/TS 62396-2 Ed. 1.0
發布時間：2008/8/19 0:00:00
標準類別：TechnicalSpecification
出版單位：International Electrotechnical Committee
標準頁數：27
標準簡介
IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
本標準替代的舊標準
替代本標準的新標準
