ISO 22489:2016現(xiàn)行
Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
出版：International Organization for Standardization
專家解讀視頻
Provides requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using a wavelength dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanning electron microscope (SEM).
NEN ISO 22489 : 2016 - Identical
BS ISO 22489 : 2016 - Identical
NEN ISO 22489 : 2016 - Identical
SAC GB/T 28634 : 2012 - Identical
BS ISO 22489 : 2016 - Identical
NF ISO 22489 : 2007 - Identical
