EIA JESD 354:1968 (R2009)現(xiàn)行
The Measurement Of Transistor Equivalent Noise Voltage And Equivalent Noise Current At Frequencies Of Up To 20 Khz
出版：JEDEC Solid State Technology Association
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基本信息
標準編號： EIA JESD 354:1968 (R2009)
發(fā)布時間：2009/3/1 0:00:00
標準類別：Standard
出版單位：JEDEC Solid State Technology Association
標準頁數：14
標準簡介
Provides a method for determining values, for device registration purposes, for transistor equivalent noise voltage and equivalent noise current at frequencies up to 20 kHz. This method is applicable to transistors whose noise has a Gaussian, flat (white) or l/f power distribution.
標準備注
Renamed from EIA 354. (07/2010)
本標準替代的舊標準
