IEC 62951-1 Ed. 1.0現行
Semiconductor devices - Flexible and stretchable semiconductor devices Part 1: Bending test method for conductive thin films on flexible substrates
出版：International Electrotechnical Committee
專家解讀視頻
基本信息
標準編號： IEC 62951-1 Ed. 1.0
發布時間：2017/4/10 0:00:00
標準類別：Standard
出版單位：International Electrotechnical Committee
標準頁數：20
標準簡介
Describes a bending test method to measure the electromechanical properties or flexibility of conductive thin films deposited or bonded on flexible non-conductive substrates.
