IEC 60749-3 Ed. 2.0現行
Semiconductor devices - Mechanical and climatic test methods Part 3: External visual examination
出版：International Electrotechnical Committee
專家解讀視頻
基本信息
標準編號： IEC 60749-3 Ed. 2.0
發布時間：2017/3/3 0:00:00
標準類別：Standard
出版單位：International Electrotechnical Committee
標準頁數：16
標準簡介
Aims to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.
本標準替代的舊標準
