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PD IEC TS 61967-3:2014現(xiàn)行
Integrated Circuits - Measurement Of Electromagnetic Emissions - Part 3: Measurement Of Radiated Emissions - Surface Scan Method
出版：British Standards Institution
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基本信息
標(biāo)準(zhǔn)編號： PD IEC TS 61967-3:2014
發(fā)布時(shí)間：2014/9/30 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：British Standards Institution
標(biāo)準(zhǔn)頁數(shù)：0
標(biāo)準(zhǔn)簡介
Gives a test procedure which defines an evaluation method for the near electric, magnetic or electromagnetic field components at or near the surface of an integrated circuit (IC).
標(biāo)準(zhǔn)備注
Supersedes DD IEC TS 61967-3. (09/2014)
