IEC 60749-28 Ed. 1.0現(xiàn)行
Semiconductor devices - Mechanical and climatic test methods Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
出版：International Electrotechnical Committee
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基本信息
標準編號： IEC 60749-28 Ed. 1.0
發(fā)布時間：2017/3/28 0:00:00
標準類別：Standard
出版單位：International Electrotechnical Committee
標準頁數(shù)：48
標準簡介
Describes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
