ISO 15632:2012現行
Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
出版：International Organization for Standardization
專家解讀視頻
Describes the most important quantities that characterize an energy-dispersive X-ray spectrometer consisting of a semiconductor detector, a pre-amplifier and a signal-processing unit as the essential parts.
BS ISO 15632:2012 - Identical
NF ISO 15632 : 2012 - Identical
DIN ISO 15632 : 2015 - Identical
BS ISO 15632 : 2012 - Identical
DIN ISO 15632 E : 2015 - Identical
DIN ISO 15632 E : 2015 - Identical
NF ISO 15632 : 2012 - Identical
BS ISO 15632 : 2012 - Identical
DIN ISO 15632 : 2015 - Identical
