IEC 60749-4 Ed. 2.0現行
Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
出版：International Electrotechnical Committee
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基本信息
標準編號： IEC 60749-4 Ed. 2.0
發布時間：2017/3/3 0:00:00
標準類別：Standard
出版單位：International Electrotechnical Committee
標準頁數：14
標準簡介
Gives a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
本標準替代的舊標準
