ISO 20263:2017現行
Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials
出版：International Organization for Standardization
專家解讀視頻
基本信息
標準編號： ISO 20263:2017
發布時間：2017/12/1 0:00:00
標準類別：Standard
出版單位：International Organization for Standardization
標準頁數：45
標準簡介
Describes a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials
本標準替代的舊標準
