ISO 17470:2014現行
Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
出版：International Organization for Standardization
專家解讀視頻
Provides guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume (on a (mu)m[3] scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
BS ISO 17470 : 2014 - Identical
NF ISO 17470 : 2006 - Identical
NEN ISO 17470 : 2004 - Identical
BS ISO 17470 : 2014 - Identical
