I.S. EN 60749-6:2017現行
Semiconductor Devices - Mechanical and Climatic Test Methods Part 6: Storage at High Temperature
出版：National Standards Authority of Ireland
專家解讀視頻
Defines the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.
BS EN 60749-6:2017 - Identical
EN 60749-6:2017 - Identical
DIN EN 60749-6 : 2016 - Identical
BS EN 60749-6 : 2017 - Identical
NF EN 60749-6 : 2002 - Identical
EN 60749-6 : 2017 - Identical
BS EN 60749-6 : 2002 - Identical
NBN EN 60749-6 : 2003 - Identical
UNE EN 60749-6 : 2003 - Identical
DIN EN 60749-6 : 2016 - Identical
