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EIA JEP 172:2014被替代

Discontinuing Use Of The Machine Model For Device Esd Qualification

出版：Joint Electronics Device Engineering Council (JEDEC)

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基本信息
標(biāo)準(zhǔn)編號(hào)： EIA JEP 172:2014
發(fā)布時(shí)間：2014/7/1 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：Joint Electronics Device Engineering Council (JEDEC)
標(biāo)準(zhǔn)頁(yè)數(shù)：20
標(biāo)準(zhǔn)簡(jiǎn)介

Demonstrates evidence to discontinue use of "machine model" particular model stress test without incurring any reduction in the IC component's ESD reliability for manufacturing. Aims to provide the necessary technical arguments for strongly recommending no further use of this model for IC qualification.

替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)

EIA JEP 172:2015