IEC 60749-9 Ed. 2.0現行
Semiconductor devices - Mechanical and climatic test methods Part 9: Permanence of marking
出版：International Electrotechnical Committee
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基本信息
標準編號： IEC 60749-9 Ed. 2.0
發布時間：2017/3/3 0:00:00
標準類別：Standard
出版單位：International Electrotechnical Committee
標準頁數：14
標準簡介
Aims to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.
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