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MDR 22 : LATEST已作廢
MICROCIRCUIT SCREENING ANALYSIS
出版：The Reliability Information Analysis Center
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基本信息
標(biāo)準(zhǔn)編號(hào)： MDR 22 : LATEST
標(biāo)準(zhǔn)類別：Standard
出版單位：The Reliability Information Analysis Center
標(biāo)準(zhǔn)頁數(shù)：0
標(biāo)準(zhǔn)簡(jiǎn)介
Contains screen fallout rates for integrated circuits which provide a valuable baseline for defining expected fallout values for various device types and stress screen variables. Digital, linear, interface and memory devices are covered in this document.
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