ISO 19668:2017現行
Surface chemical analysis - X-ray photoelectron spectroscopy - Estimating and reporting detection limits for elements in homogeneous materials
出版：International Organization for Standardization
專家解讀視頻
基本信息
標準編號： ISO 19668:2017
發布時間：2017/8/14 0:00:00
標準類別：Standard
出版單位：International Organization for Standardization
標準頁數：24
標準簡介
Defines a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported.
