Defines a procedure for the non-destructive measurement of coating thicknesses using beta backscatter gauges. Relates to both metallic and non-metallic coatings on both metallic and non-metallic substrates. To use this method, the atomic numbers or equivalent atomic numbers of the coating and the substrate must differ by an appropriate amount. Includes references to definitions, principle, instrumentation, factors relating to accuracy, calibration of instruments, measuring procedure, measuring accuracy and precision, test report, isotopes used with beta backscatter gauges, atomic numbers of some commonly used coatings and substrates and saturation thickness.

? British Standards Institution 2013

Amendment notes:
AMD 16494 published 30 June 2006
AMD 16494 is a Corrigendum

BS 5411-12(1981) : 1981 AMD 8490

97/120769 DC : FEB 97

97/120769 DC

BS EN ISO 3543:1995

UNI EN ISO 3543:2001 - Identical

SN EN ISO 3543:2001 - Identical

NEN EN ISO 3543:2001 - Identical

DIN EN ISO 3543 (2001-12) - Identical

ONORM EN ISO 3543:2006 - Identical

NBN EN ISO 3543:2001 - Identical

UNI EN ISO 3543:1997 - Identical

NF EN ISO 3543:2001 - Identical

I.S. EN ISO 3543:2001 - Identical

NS EN ISO 3543 Ed. 2 (2001) - Identical

UNE EN ISO 3543:2001 - Identical

ISO 3543:2000 - Identical

SS EN ISO 3543:2001 - Identical