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IEC 61326-2-1 Ed. 2.0現(xiàn)行

Electrical equipment for measurement, control and laboratory use - EMC requirements Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications

出版：International Electrotechnical Committee

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基本信息
標(biāo)準(zhǔn)編號： IEC 61326-2-1 Ed. 2.0
發(fā)布時(shí)間：2012/10/2 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：International Electrotechnical Committee
標(biāo)準(zhǔn)頁數(shù)：16
標(biāo)準(zhǔn)簡介

IEC 61326-2-1:2012 specifies more detailed test configurations, operational conditions and performance criteria for equipment with test and measurement circuits (both internal and/or external to the equipment) that are not EMC protected for operational and/or functional reasons, as specified by the manufacturer. This second edition cancels and replaces the first edition published in 2005. This edition constitutes a technical revision. The main technical changes are: Update with respect to IEC 61326-1:2012. This publication is to be read in conjunction with IEC 61326-1:2012.

本標(biāo)準(zhǔn)替代的舊標(biāo)準(zhǔn)

IEC 61326-2-1 Ed. 1.0

等同采用的國際標(biāo)準(zhǔn)

BS EN 61326-2-1:2013 - Identical