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ASTM F615M-95(2002)被替代
Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components [Metric]
出版：American Society for Testing and Materials
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基本信息
標(biāo)準(zhǔn)編號： ASTM F615M-95(2002)
發(fā)布時(shí)間：1995/5/15 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：American Society for Testing and Materials
標(biāo)準(zhǔn)頁數(shù)：5
標(biāo)準(zhǔn)簡介
CONTAINED IN VOL. 10.04, 2006Covers procedures for determining operating regions that are safe from metallization burnout induced by current pulses of less than 1-s duration.
標(biāo)準(zhǔn)備注
Supersedes ASTM F 615
(12/2001)
替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)
