JIS C 5402-6-2:2005現(xiàn)行
Connectors for electronic equipment - Tests and measurements Part 6-2: Dynamic stress tests - Test 6b: Bump
出版：Japanese Standards Association
專家解讀視頻
基本信息
標準編號： JIS C 5402-6-2:2005
發(fā)布時間：2005/3/20 0:00:00
標準類別：Standard
出版單位：Japanese Standards Association
標準頁數(shù)：3
標準簡介
This section of JIS C 5402-6 is to define a standard test method to assess the ability of components to withstand specified severities of bump. This test may also be used for similar devices when specified in a detail specification.
等同采用的國際標準
IEC 60512-6-2 Ed. 1.0 - Identical
