當(dāng)前位置：
首頁(yè) >
標(biāo)準(zhǔn)詳情頁(yè)
IEC 60749-3 Ed. 2.0現(xiàn)行
Semiconductor devices - Mechanical and climatic test methods Part 3: External visual examination
出版：International Electrotechnical Committee
專家解讀視頻
基本信息
標(biāo)準(zhǔn)編號(hào)： IEC 60749-3 Ed. 2.0
發(fā)布時(shí)間：2017/3/3 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：International Electrotechnical Committee
標(biāo)準(zhǔn)頁(yè)數(shù)：16
標(biāo)準(zhǔn)簡(jiǎn)介
Aims to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.
本標(biāo)準(zhǔn)替代的舊標(biāo)準(zhǔn)
