IEC 60749-24 Ed. 1.0現行
Semiconductor devices - Mechanical and climatic test methods Part 24: Accelerated moisture resistance - Unbiased HAST
出版：International Electrotechnical Committee
專家解讀視頻
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
OVE/ONORM EN 60749-24:2004 - Identical
NEN EN IEC 60749-24:2004 - Identical
EN 60749-24:2004 - Identical
BS EN 60749-24:2004 - Identical
DIN EN 60749-24 (2004-09) - Identical
NF EN 60749-24:2005 - Identical
I.S. EN 60749-24:2004 - Identical
PN EN 60749-24:2006 - Identical
SS EN 60749-24 Ed. 1 (2004) - Identical
UNE EN 60749-24:2005 - Identical
