VDE 0884-749-28 : 2018現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL (IEC 60749-28:2017)
出版：Verband Deutscher Elektrotechniker
專家解讀視頻
