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NEN EN 50527-1:2010被替代
Procedure For The Assessment Of The Exposure To Electromagnetic Fields Of Workers Bearing Active Implantable Medical Devices - Part 1: General
出版：Nederlands Normalisatie Instituut
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基本信息
標(biāo)準(zhǔn)編號(hào)： NEN EN 50527-1:2010
發(fā)布時(shí)間：2010/5/1 0:00:00
標(biāo)準(zhǔn)類(lèi)別：Standard
出版單位：Nederlands Normalisatie Instituut
標(biāo)準(zhǔn)頁(yè)數(shù)：39
標(biāo)準(zhǔn)簡(jiǎn)介
Defines a procedure in order to assess the risk to workers bearing one or more active implantable medical devices from exposure to electric, magnetic and electromagnetic fields at a workplace. It also defines how to perform a general risk assessment and to determine whether it is necessary to carry out a detailed risk assessment.
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替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)
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EN 50527-1:2016 - Identical
