CEI EN 60749-4 : 2004現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)
出版：Comitato Elettrotecnico Italiano
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基本信息
標準編號： CEI EN 60749-4 : 2004
發布時間：2004/1/1 0:00:00
標準類別：Standard
出版單位：Comitato Elettrotecnico Italiano
標準頁數：16
標準簡介
Gives the highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
本標準替代的舊標準
