
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
出版:American Society for Testing and Materials

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基本信息
標準編號: ASTM F76-86(2002)
發布時間:1986/10/31 0:00:00
標準類別:Standard
出版單位:American Society for Testing and Materials
標準頁數:13
標準簡介
CONTAINED IN VOL. 10.04, 2006Gives methods for measuring resistivity and Hall coefficientof single-crystal semiconductor specimens, which differ substantially in requirements.
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