Specifies particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.

IEC 60300-3-7 : 1.0

NEN IEC 61163-1 : 95 C1 2000 - Identical

UNE EN 61163-1 : 2010 - Identical

BIS IS 15444-1 : 2012(R2016) - Identical

DS EN 61163-1 : 2007 - Identical

CEI EN 61163-1 : 2007 - Identical

I.S. EN 61163-1:2006 - Identical

NEN EN IEC 61163-1 : 2007 - Identical

UNE 200004-1 : 2002 - Identical

CEI 56-35 : 1ED 2000 - Identical

BS EN 61163-1 : 2006 - Identical

NEN 11163-1 : 1995 - Identical

PN EN 61163-1 : 2008 - Identical

DIN EN 61163-1 : 2007 - Identical