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IEC 62435-5 : 1ED 2017現(xiàn)行
ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 5: DIE AND WAFER DEVICES
出版：International Electrotechnical Committee
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基本信息
標(biāo)準(zhǔn)編號(hào)： IEC 62435-5 : 1ED 2017
標(biāo)準(zhǔn)類別：Standard
出版單位：International Electrotechnical Committee
標(biāo)準(zhǔn)頁數(shù)：0
標(biāo)準(zhǔn)簡介
Pertains to long-term storage of die and wafer devices and establishes specific storage regimen and conditions for singulated bare die and partial or complete wafers of die including die with added structures such as redistribution layers and solder balls or bumps or other metallisation.
