
STEADY STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
出版:International Electrotechnical Committee

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基本信息
標準編號: IEC PAS 62161 : 1.0
發(fā)布時間:2000/8/22 0:00:00
標準類別:Standard
出版單位:International Electrotechnical Committee
標準頁數(shù):14
標準簡介
Aims at evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs conditions of temperature, humidity and bias which accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.
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