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JIS C 5402-6-3:2005現(xiàn)行
Connectors for electronic equipment - Tests and measurements Part 6-3: Dynamic stress tests - Test 6c: Shock
出版：Japanese Standards Association
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基本信息
標(biāo)準(zhǔn)編號(hào)： JIS C 5402-6-3:2005
發(fā)布時(shí)間：2005/3/20 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：Japanese Standards Association
標(biāo)準(zhǔn)頁數(shù)：3
標(biāo)準(zhǔn)簡介
This section of JIS C 5402-6 is to define a standard test method to assess the ability of components to withstand specified severities of shock. This test may also be used for similar devices when specified in a detail specification.
等同采用的國際標(biāo)準(zhǔn)
IEC 60512-6-3 Ed. 1.0 - Identical
