EIA JESD 22-A117:2011現行
Electrically Erasable Programmable Rom (Eeprom) Program/Erase Endurance And Data Retention Stress Test
出版：JEDEC Solid State Technology Association
專家解讀視頻
基本信息
標準編號： EIA JESD 22-A117:2011
發布時間：2011/10/1 0:00:00
標準類別：Standard
出版單位：JEDEC Solid State Technology Association
標準頁數：23
標準簡介
Establishes the ability of an EEPROM integrated circuit or an integrated circuit with an EEPROM module (such as a microprocessor) to sustain repeated data changes without failure (program/erase endurance) and to retain data for the expected life of the EEPROM (data retention). Provides the procedural requirements for performing valid endurance and retention tests based on a qualification specification.
標準備注
Supersedes EIA JESD 22 (07/2004)
本標準替代的舊標準
