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DS EN 60749-9:2002被替代
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 9: Permanence Of Marking
出版：Danish Standards
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標(biāo)準(zhǔn)編號(hào)： DS EN 60749-9:2002
發(fā)布時(shí)間：2003/1/8 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：Danish Standards
標(biāo)準(zhǔn)頁(yè)數(shù)：16
標(biāo)準(zhǔn)簡(jiǎn)介
Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)
