IEC 60376B : 1.0被替代
SPECIFICATION AND ACCEPTANCE OF NEW SULFUR HEXAFLUORIDE - SECOND SUPPLEMENT: CLAUSE 26
出版：International Electrotechnical Committee
專家解讀視頻
Contains a method for measuring the dew-point and provides a method for the determination of condensable impurities in new sulfur hexafluoride.
NEN 10376 : 1982 - Identical
DIN VDE 0373-1 : 1980 - Corresponds
CEI 10-7 : 1ED 1997 - Identical
DIN IEC 60376 : 1980 - Identical
NFC 27 601 : 1978 - Identical
DIN IEC 60376 : 1980 - Identical
NEN 10376 : 1982 - Identical
DIN VDE 0373-1 : 1980 - Identical
VDE 0373-1 : 2006 - Identical
CEI 10-7 : 1ED 1997 - Identical
