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IEC 60748-20 Ed. 1.0現(xiàn)行

Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits

出版:International Electrotechnical Committee

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基本信息
標(biāo)準(zhǔn)編號(hào): IEC 60748-20 Ed. 1.0
發(fā)布時(shí)間:1988/6/30 0:00:00
標(biāo)準(zhǔn)類別:Standard
出版單位:International Electrotechnical Committee
標(biāo)準(zhǔn)頁(yè)數(shù):83
標(biāo)準(zhǔn)簡(jiǎn)介

Applies to film integrated circuits and to hybrid film integrated circuits both passive and active. Applies also to partly-completed F and HFICs supplied to customers for subsequent processing as well as to chip carrier circuits having more than one chip, provided that they have been interconnected by film interconnection techniques. This specification defines the quality assessment procedures and the methods for electrical, climatic, mechanical and endurance tests. It outlines the requirements which shall be applied to the release of circuits using either qualification approval procedures or capability approval procedures.

本標(biāo)準(zhǔn)替代的舊標(biāo)準(zhǔn)

IEC 60148B

等同采用的國(guó)際標(biāo)準(zhǔn)

NEN 10748-20:1989 - Identical

SS IEC 748 Ed. 2 (1993) - Identical

BS QC 763000:1990 - Identical

BS QC 760000:1990 - Equivalent

DIN IEC 60748-20 (1990-10) - Identical

本標(biāo)準(zhǔn)修訂后的版本

IEC 60748-20 Amd.1 Ed. 1.0 -