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IEC 62433-2 Ed. 1.0被替代

EMC IC modelling Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

出版:International Electrotechnical Committee

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基本信息
標準編號: IEC 62433-2 Ed. 1.0
發布時間:2008/10/8 0:00:00
標準類別:Standard
出版單位:International Electrotechnical Committee
標準頁數:43
標準簡介

IEC 62433-2:2008 specifies macro-models for ICs to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE model can also be used for modelling an IC-die, a functional block and an Intellectual Property block (IP). The ICEM-CE model can be used to model both digital and analogue ICs. Basically, conducted emissions have two origins: - conducted emissions through power supply terminals and ground reference structures; - conducted emissions through input/output (I/O) terminals. The ICEM-CE model addresses those two types of origins in a single approach. This standard defines structures and components of the macro-model for EMI simulation taking into account the IC's internal activities. This standard gives general data, which can be implemented in different formats or languages such as IBIS, IMIC, SPICE, VHDL-AMS and Verilog. SPICE is however chosen as default simulation environment to cover all the conducted emissions. This standard also specifies requirements for information that shall be incorporated in each ICEM-CE model or component part of the model for model circulation, but description syntax is not within the scope of this standard.

替代本標準的新標準

IEC 62433-2 Ed. 2.0

等同采用的國際標準

NF EN 62433-2:2007 - Identical

BS EN 62433-2:2010 - Identical