IEC 60748-23-2 : 1.0現行
SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - PART 23-2: HYBRID INTEGRATED CIRCUITS AND FILM STRUCTURES - MANUFACTURING LINE CERTIFICATION - INTERNAL VISUAL INSPECTION AND SPECIAL TESTS
出版：International Electrotechnical Committee
專家解讀視頻
Applicable to high quality approval systems for hybrid integrated circuits and film structures. The purpose of the tests is to perform visual inspections on the internal materials, construction and workmanship of hybrid, multichip and multichip module microcircuits and passive elements used for microelectronic applications including r.f./microwave.
BS IEC 60748-23-2 : 2002 - Identical
NEN IEC 60748-23-2 : 2002 - Identical
NEN IEC 60748-23-2 : 2002 - Identical
BS IEC 60748-23-2 : 2002 - Identical
