
Testing of Ceramic and Basic Materials - Direct Determination of Mass Fractions of Impurities in Powders and Granules of Silicon Carbide by Inductively Coupled Plasma Optical Emission Spectrometry (icp Oes) With Electrothermal Vaporisation (etv)
出版:National Standards Authority of Ireland

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基本信息
標準編號: I.S. EN 15991:2015
發(fā)布時間:2015/12/16 0:00:00
標準類別:Standard
出版單位:National Standards Authority of Ireland
標準頁數(shù):30
標準簡介
Specifies a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.
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